For a full list of publications please visit Google Scholar.
Rai BK, (2019).
Advanced Deep Learning with R: Become an expert at designing, building, and improving advanced neural network models using R
Packt Publishing, ASIN: B07ZFN5MXN.
Rai BK, Singh N, (2009).
Reliability Analysis and prediction from Warranty Data: Issues, Strategies, and Methods CRC Press Taylor & Francis Company, ISBN: 9781439803257.
Rai BK, Meshram A, (2020).
Application of neural network to detect freezing of gait in patients with Parkinson’s disease
Chapter in book titled Soft Computing, edited by Mangey Ram and S. B. Singh
De Gruyter, Published in 2020, eISBN: 9783110628616.
Rai BK, (2020).
Supervised Machine Learning: Application Example Using Random Forest in R
chapter in book titled Mathematics Applied to Engineering and Management, edited by Mangey Ram and S. B. Singh
CRC Press Taylor & Francis Company, ISBN: 978-0-8153-5804-6.
Meshram, A., and Rai, B. (2019).
User-Independent Detection for Freezing of Gait in Parkinson’s Disease Using Random Forest Classification
International Journal of Big Data and Analytics in Healthcare, 4(1), 57-72.
Xiaoling, Lu.; Rai, B.; Yan, Z.; Li, Y. (2018).
Cluster-based Smartphone Predictive Analytics for Application Usage and Next Location Prediction
International Journal of Business Intelligence Research , 9(2), 64-80.
Rai, Bharatendra; Nepal, Bimal; Gunasekaran, Angappa; Li, Julia (2013).
Optimization of process audit plan for minimizing vehicle launch risk using MILP
International Journal of Procurement Management, 6, 379-393.
Gunasekaran, Angappa; Rai, Bharatendra; Griffin, Michael (2011).
Competitiveness of Small and Medium size Enterprises: An Empirical Research
International Journal of Production Research, 19, 5489-5509.
Rai BK (2009).
Warranty Spend Forecasting for Subsystem Failures Influenced by Calendar Month Seasonality
IEEE Transactions on Reliability, 58(4), 649-657.
Rai BK, Singh N (2006).
Customer-rush near warranty expiration limit and nonparametric hazard rate estimation from known mileage accumulation rates
IEEE Transactions on Reliability, 55(3), 480-489.
For more publications please also visit Research.